Fault Injection and Key Retrieval Experiments on an Evaluation Board - Fault Analysis in Cryptography - page 303

Table 18.1 Equipments used in experiments

Equipment Product name and model number

Oscilloscope LeCroy WaveMaster 8600A

Pulse generator Agilent 81150A

DC power supply Agilent E3646A

Target device Cryptographic LSI (I) or (II) mounted on SASEBO-R shown in Table 18.2

Oscilloscope

DC power sapply

Pulse generator

Crypto LSI

Evaluation board

Evaluation board
SASEBO-R

FPGA

Serial
IC

Data
controller

PC

Input/
Output

RS232C

Data/Control

CLK_A (24MHz)

Crypto LSI

Pulse
generator
Agilent
81150A

0

Phase
controlled

CLK (w/ glitch)

EXEC

MUX

Oscilloscope
LeCroy
WaveMaster 8600A

1

CLK_B (24MHz)

Selector

Glitch
controller

CLK
Timing

Trigger_out

Fig. 18.3 Overview of experimental environment

of the crypt calculation. This experience is useful if we evaluate another LSI that
does not output any signal related to the execution of a cryptographic algorithm.
We show a schematic for generating a clock with the glitch in Fig. 18.4 . This graph
shows the method for generating a clock with the glitch from two clock sources