Models for Bridging Defects Test and Diagnosis - Models in Hardware Testing - page 64

a b

Impact of downstream
current

Leakage

V Tn V DD - V Tp V E Number of patterns

Fig. 2.27 Example in Fig. 2.26 a . ( a ) Downstream current vs. node voltage and ( b ) current

signature

a b

1000 1000

800

800

600

600

400

400

200

200

0

0

0 500 1000 1500 2000 2500

0 500 1000 1500 2000 2500

Pattern number Number of Patterns

Fig. 2.28 Current signature at nominal V DD for a real defective device. ( a ) Non-ordered and
( b ) ordered ( Arumı 2008 )

a b

250

250

200

200

150

150

100

100

50

50

0 0

0 500 1000 1500 2000 2500 0 500 1000 1500 2000 2500

Pattern number Number of Patterns

Fig. 2.29 Current signature at very low V DD for a real defective device. ( a ) Non-ordered and
( b ) ordered ( Arumı 2008 )

defective circuit (0:18 m NXP Semiconductors) obtained at the nominal V DD and
low V DD , respectively. Figure 2.30 illustrates the bridging defect diagnosed with the
proposed signature-based methodology.