Reversible Logic Based Design and Test of Field Coupled Nanocomputing Circuits - Field-Coupled Nanocomputing: Paradigms, Progress, and Perspectives - page 154

Fig. 18. QCA Layout of Fredkin Gate. CW represents cross wire resulted from inter-
section of binary wire and inverter chain, MV represents majority voter
In QCA manufacturing, defects can occur during the synthesis and deposition
phases, although defects are most likely to take place during the deposition phase
[ 62 ]. Researchers assume that QCA cells have no manufacturing defect; in metal
QCA, faults occur due to cell misplacement. These defects can be characterized
as cell displacement, cell misalignment and cell omission [ 23 ]. Researchers have