Environmental Engineering Reference
In-Depth Information
Table 10.2 Electrocaloric properties of thick- lm ceramics
Material
a
(K) Δ
E (MVm 1 ) q r,max
(Jkg 1 )
Δ
T ad
(K)
Δ
s is
(Jkg 1 K 1 )
T ref
Measurement
procedure
Note References
MC b
BaTiO 3
7.1
50
333 80
16,473 Direct
[ 24 ]
MC b
BaTiO 3
0.55
/
350 30
/
Direct
[ 25 ]
MC b
PST
2.4
/
/
13.8
/
Direct
[ 28 ]
PLZT
8/65/35
1.8
1.5
384 6.8
575
Direct
/
[ 29 ]
a T ref
temperature at which
Δ
T ad ,
Δ
s is and q r,max were obtained
b MC
multilayer capacitor
lm ceramics have attracted a lot of attention due to the discovery of the
so-called giant electrocaloric effect in PZT thin-
Thin-
lm ceramics [ 8 ]. The thickness of
these materials can be as little as a few 100 nm and hence direct measurements are a
great challenge. Therefore, the evaluation of the electrocaloric effect in thin-
lm
materials is usually reported on the basis of indirect measurements. For example, in
2013 Peng et al. [ 30 ] predicted an electrocaloric effect of 45.3 K in thin-
lm
Pb 0.8 Ba 0.2 ZrO 3 (PBZ) ceramics obtained by an indirect measurement. Nevertheless,
Lu et al. [ 31 ] reported on a directly measured electrocaloric effect of 40 K in
400-nm-thick La-doped Pb(ZrTi)O 3 (PLZT) relaxor ceramics. Some other thin-
lm
ceramic materials, together with their electrocaloric properties, are presented in
Table 10.3 . In comparison with bulk and thick-
lm ceramics, the electrocaloric
effect in thin-
lm ceramics can be one order larger. The main reason for this lies in
the higher dielectric strength of thin-
lm materials, which can be as high as
120 MVm 1 [ 31 ].
In conclusion, it can be said that all three groups of ceramics have the potential
for future cooling or other energy conversion applications. Though bulk ceramics
do not exhibit suf
cient adiabatic temperature changes to be used in a single-stage
cooling device, they could be applied in devices where heat regeneration allows a
signi
lm
ceramics, which are usually in the form of a multilayer capacitor. However, they
cant increase of the temperature span [ 37 ]. This also holds true for thick-
Table 10.3 Electrocaloric properties of thin-lm ceramics
Material
a
(K)
Δ E (MVm 1 ) q r,max
(Jkg 1 )
Δ T ad
(K)
Δ s is
(Jkg 1 K 1 )
T ref
Measurement
procedure
References
PLZT 8/65/35
40
50
318 120
14,900 Direct
[ 31 ]
PBZ
45.3
/
290 59.8
/
Indirect
[ 30 ]
PMN-0.35PT
31
/
413 74.7
/
Indirect
[ 32 ]
PMN-0.1PT
5
/
348 89.5
/
Indirect
[ 33 ]
PMN-0.07PT
9
/
298 72.3
/
Indirect
[ 34 ]
PST
6.2
6.3
341 77.4
2,129
Indirect
[ 35 ]
PZ
11.4
/
508 40
/
Indirect
[ 36 ]
PZT
12
/
499 48
/
Indirect
[ 8 ]
a T ref temperature, at which Δ T ad , Δ s is and q r,max were obtained
Search WWH ::




Custom Search