Advanced Methods for the Analysis of Semiconductor Manufacturing Process Data - Advanced Techniques in Knowledge Discovery and Data Mining - page 60

(a)

Pre-
processing

Dimension
reduction

Data-
base

Pre-
processing

Dimension
Reduction

Data-
base

Features 2D coordinates

Attributes Visualization

Uncompressed
data

(b)

(c)

Fig. 2.18. Feature space reduction and interactive visualization: (a) Architecture
and dedicated tools; (b)WeightWatcher; and (c) acoustic navigator.