Biomedical Engineering Reference
In-Depth Information
E
41352968107
35241810 796
24135796810
135246810 79
52413107 968
14
E
11
13
15
12
19
16
18
20
17
E
13
15
12
14
11
18
20
17
19
16
12
14
11
13
15
17
19
16
18
20
E
11
13
15
12
14
16
18
20
17
19
15
12
14
11
13
20
17
19
16
18
: Partition 1 (pins 1-5)
: Partition 3 (pins 11-15)
: Partition 2 (pins 6-10)
: Partition 4 (pins 16-20)
Figure 4.37
The functional test on an array-partitioning-based chip.
boundary of Partition 2 and Partition 4 and E
3
on the boundary of Partition 1
and Partition 3, use completely different sets of control pins. Thus, these tests
can be carried out concurrently. This increases the parallelism of the func-
tional test. Moreover, a higher test frequency (i.e., droplet activation rate) can
be used to shorten the test time.
4.5.4.4 Broadcast-Addressing-Based Chip
Next, we apply the functional test method to a broadcast-addressing-based
chip. Due to the constraints introduced by the pin-assignment results, not all
the cells on the chip can be tested. For example, the mixing and splitting test
cannot be applied in the highlighted area in Figure 4.38b. To split the droplet
seated on E
2
into two small droplets seated on E
1
and E
3
, we need to highlight
Pin 12 and 14. However, since the electrode above E
3
will also be activated,
the small droplet which is supposed to be seated on E
3
will be seated on the
boundary of E
3
and the electrode above it.
However, as discussed in Section 3.3, a broadcast-addressing-based chip is
designed to execute for a predetermined set of known bioassays. We know
exactly where the mixing and splitting operations will be carried out. So, there
is no need to test for malfunctions on other cells on the chip. Since the number
of electrodes to be tested is very limited, only a small number of test steps is
needed. Again, a higher test frequency can be used to reduce test time. To fur-
ther increase concurrence, we can use the algorithm presented in [63] to check
the compatibility of droplet movements during the functional test.
