Artifacts in Transmission Electron Microscopy - Sample Preparation Topic for Transmission Electron Microscopy - page 170

Bibliography

Ayache, J. and Albarede, P.H. (1994). New Application of Klepeis Ion Mill Free Sample
Preparation to YBCO System Thin Films and Bulk Ceramics, P. H. ICEM 13, 1. Les Editions
de Physique, Paris, 1023-1024.
Ayache, J. and Albarede, P.H. (1995). TEM cross section preparation by ionless tripod pol-
isher method applied to YBCO superconducting multilayer thin films and bulk ceramics.
Ultramicroscopy , 60, 195-206.
Ayache, J., Thorel, A., Lesueur, J., and Dahmen, U. (1998). Characterization of a three-
dimensional grain boundary topography in a YBa2Cu3O7 thin film bicrystal grown on a SrTiO3
substrate. J. Appl. Phys. , 84( 9), 4921-4928.
Ayache, J., Kisielowski, C., Kilaas, R., Passerieux, G., and Lartigue-Korinek, S. (2005).
Determination of the atomic structure of a 13 SrTiO 3 grain boundary. J. Mater. Sci. , 40,

3091-3100.
Böhler, S. (1970). Artefacts and Specimen preparationfaults in freeze etch technology , Balzers AG.
Liechtenstein.
Bouchet, D. and Colliex, C. (2003). Experimental study of ELNES at grain boundaries in alu-
mina: Intergranular radiation damage effects on Al-L 23 and O-K edges. Ultramicroscopy , 96,
139-152.
Bouleau, D. (1974). La préparation des répliques destinées à l'observation des échantillons d'acier
en MET-IRSID, 1996. Dalmai-Imelik G., Leclercq Ch., Mutin J., J. de Microscopie , 20, 123.
Cavalier, A., Spehner, D., and Humbel, B.M. (eds.). (2008). Handbook of Cryo-Preparation
Methods for Electron Microscopy . CRC Press, Boca Raton.
Crang, R.F.E. and Klomparens, K.L. (1988). Artefacts in Biological Electron Microscopy , Plenum
Press, New York.
Kato, N.I., Kohno, Y., and Saka, H. (1999). Side-wall damage in a transmission electron
microscopy specimen of crystalline Si pepared by focused ion beam etching. J. Vac. Sci.
Technol. A. , 17 (4), 1201-1204.
McCaffrey, J.P., Phaneuf, M.W., Madsen, L.D. (2001). Surface damage formation during ion-beam
thinning of samples for transmission électron microscopy. Ultramicroscopy , 87 , 97-104.