As-Produced Intrinsic Physico-Chemical Properties and Appropriate Characterization Tools - Safety of Nanomaterials along Their Lifecycle - page 4

TABLE 1.1 ( continued )
Measurement Methods and Relevant Standards Based on ISO/TR 13014:2012

Parameter Measurement Methods Relevant Standards

Composition X-ray photoelectron spectroscopy

X-ray fluorescence
Auger electron spectroscopy
X-ray diffraction
Raman spectroscopy
ThermoGravimetric Analysis
Ultraviolet/visible spectrometry
Nuclear magnetic resonance
Inductively coupled plasma- optical
emission spectrometer (ICP-OES)
Inductively coupled plasma-mass
spectrometer (ICP-MS)
SEM

ISO 22309:2006;
ISO 22489:2006;
ISO 24173:2009;
ISO 13084:2011;
ISO 18114:2003

Surface chemistry Auger electron spectroscopy

Scanning Auger electron microscopy
X-ray photoelectron spectroscopy
Secondary ion mass spectrometry
3D atom probe tomography
Energy dispersive X-Ray
spectrometry
Electron energy loss spectroscopy
Low energy ion spectroscopy
Raman and other molecular
spectroscopies

Under development: ISO/DTR 14187;
ISO 18115:2001; ISO 24236:2005;
ISO 15471:2004; ISO/TR
19319:2003;
ISO 17973:2002; ISO 18118:2004;
ISO 20903:2006; ISO/TR
18394:2006;
ISO 23830:2008; ISO 17560:2002;
ISO 18114:2003; ISO 20341:2003;
ISO 15472:2002; ISO 21270:2004;
ISO 24237:2005; ISO 15470:2004;
ISO 19318:2004; ISO/TR
18392:2005;
ISO 18516:2006; ISO 18117:2009;
ISO 23812:2009

Surface charge Isoelectric point

Electrophoretic light scattering
Electrophoresis
Electro-osmosis
Electric sonic amplitude
Colloidal vibration current

ISO 20998-1:2006

Solubility Possible measurement methods:

ICP-OES and ICP-MS

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Dispersibility Methods based on particle size

measurements (see above)

ISO/TC 24 new work item on
dispersion;
ISO/TR 13097