As-Produced Intrinsic Physico-Chemical Properties and Appropriate Characterization Tools - Safety of Nanomaterials along Their Lifecycle - page 3

TABLE 1.1
Measurement Methods and Relevant Standards Based on ISO/TR 13014:2012

Parameter Measurement Methods Relevant Standards

Particle size Dynamic light scattering

Small angle X-ray scattering
Size exclusion chromatography
Analysis of scanning electron
microscopy (SEM), transmission
electron microscopy (TEM) or
scanning probe microscopy (SPM)
images
Centrifugal liquid sedimentation
Raman spectroscopy
Laser-induced incandescence

ISO 9276-1:1998; ISO 9276-1:1998/
Cor 1:2004;
ISO 9276-2:2001; ISO 9276-3:2008;
ISO 9276-4:2001; ISO 9276-5:2005;
ISO 9276-6:2008; ISO 9277:2010;
ISO 13318-1:2001; ISO
13318-2:2007;
ISO 13318-3:2004; ISO 13320:2009;
ISO 13321:1996; ISO 13322-1:2004;
ISO 13322-2; ISO/TS 13762:2001;
ISO 14488:2007; ISO 14887:2000;
ISO 15900:2009; ISO 20998-1:2006;
ISO 21501-1:2009; ISO
21501-2:2007;
ISO 22412:2008; ASTM E2490-09;
ISO 16700:2004

Aggregation/
agglomeration state

Analysis of cryo-SEM or cryo-TEM
images
Angle dependent scattering at
different wavelengths
Static light scattering
Small angle X-ray scattering
X-ray diffraction
Small angle neutron scattering
Rheology methods
Centrifugal liquid sedimentation
Laser diffraction
Nanoparticle tracking analysis

ISO 9276-1:1998; ISO 9276-1:1998/
Cor 1:2004;
ISO 9276-2:2001; ISO 9276-3:2008;
ISO 9276-4:2001; ISO 9276-5:2005;
ISO 9276-6:2008; ISO 9277:2010;
ISO 13318-1:2001; ISO
13318-2:2007;
ISO 13318-3:2004; ISO 13320:2009;
ISO 13321:1996; ISO 13322-1:2004;
ISO 13322-2; ISO/TS 13762:2001;
ISO 14488:2007; ISO 14887:2000;
ISO 15900:2009; ISO 20998-1:2006;
ISO 21501-1:2009; ISO
21501-2:2007;
ISO 22412:2008; ASTM E2490-09;
ISO 16700:2004; ISO 13322-1:2004

Shape Analysis of SEM or TEM or SPM

images
Scattering techniques

ISO 16700:2004

ISO 13322-1:2004

Surface area Methods based on gas or liquid

adsorption isotherms
Liquid porosimetry
Image analysis
Laser-induced incandescence

ISO 15901-1:2005;
ISO 15901-2:2005;
ISO 15901-3:2005;
ISO 18757:2003;
ISO 13322-1:2004

( Continued )