TRENDS AND FUTURE PROSPECTS - Total-Reflection X-Ray Fluorescence Analysis and Related Methods - page 496

77. Fan, Q. and Gohshi, Y. (1993). Enhancement of total reflection X-ray fluore-
scence spectroscopy with electrochemical deposition. Appl.Spectrosc. , 47 ,

1742-1756.
78. Krämer, K. (1982). TiefenprofilanalyseanMetallenimNanometerbereichmit
elektrochemischerSchichtabtragungdurchElektropolieren , Ph. D. Thesis, Univer-
sity of Stuttgart.
79. Bormann, R. and Schwenke, H. (1992). Offenlegungsschrift DE 4028044 A1, Int.
Cl. G 01 N23/203, Deutsches Patentamt.
80. Bredendiek-Kämper, S., von Bohlen, A., Klockenkämper, R., Quentmeier, A., and
Klockow., D. (1996). Microanalysis of solid samples by laser-ablation and total-
reflection X-ray fluorescence. J.Anal.At.Spectrom. , 11 , 537-541.
81. Knoth, J., Bormann, R., Gutschke, R., Michaelsen, C., and Schwenke, H. (1993).
Examination of layered structures by total-reflection X-ray fluorescence analysis.
Spectrochim.Acta , 48B , 285-292.
82. Wiener, G., Michaelsen, C., Knoth, J., Schwenke, H., and Bormann, R. (1995).
Concentration-depth profiling using total-reflection X-ray fluorescence spectrom-
etry in combination with ion-beam microsectioning techniques. Rev.Sci.Instrum. ,
66 ,20-23.
83. Frank, W., Thomas, H.-J., and Schindler, A. (1995). Depth profiling by means of
the combination of glancing incidence x-ray fluorescence spectrometry with low
energy ion beam etching technique. Spectrochim.Acta , 50B , 265-270.
84. Sasaki, Y. and Hirokawa, K. (1990). Refraction effect of scattered X-ray fluores-
cence at surface. Appl.Phys.A , 50 , 397-404.
85. Noma, T. and Iida, A. (1994). Surface analysis of layered thin films using a
synchrotron x-ray microbeam combined with a grazing-exit condition. Rev.Sci.
Instrum. , 65 , 837-844.
86. Noma, T., Iida, A., and Sakurai, K. (1993). Fluorescent-X-ray-interference effect in
layered materials. Phys.Rev. , B48 , 17524-17526.
87. Tsuji, K. and Hirokawa, K. (1994). Takeoff angle-dependent X-ray fluorescence
of layered materials using a glancing incident X-ray beam. J.Appl.Phys. , A75 ,
7189-7194.
88. Tsuji, K., Sato, S., and Hirokawa, K. (1995). X-ray fluorescence analysis of thin
films at glancing-incident and-take-off angles. Adv.X-RayChem.Anal.Jpn. , 26s ,
151-156.
89. Sasaki, Y. (1995). Fluorescent X-ray interference from a metal monolayer and
metal-labeled proteins. Adv.X-RayChem.Anal.Jpn. , 26s , 193-198.
90. Becker, S., Golovchenko, J.A., and Patel, J.R. (1983). X-ray evanescent-wave
absorption and emission. Phys.Rev.Lett. , 50 , 153-156.
91. Hasegawa, S., Ino, S., Yamamoto, Y., and Daimon, H. (1985). Chemical analysis of
surfaces by total-reflection-angle X-ray spectroscopy in RHEED experiments
(RHEED-TRAXS). Jpn.J.Appl.Phys. , 24 , L387-L390.
92. Sasaki, Y.C. and Hirokawa, K. (1991). New non-destructive depth profile mea-
surement by using a refracted X-ray fluorescence method. Appl.Phys.Lett. , 58 ,
1384-1386.
93. Born, M. and Wolf, E. (1975). PrinciplesofOptics , Pergamon Press: New York.