Chemistry Reference
In-Depth Information
16. Alov, N.V. (2011). Total reflection X-ray fluorescence analysis: physical founda-
tions and analytical application (a review).
InorganicMaterials
,
47
, 1487-1499.
17. West, M., Ellis, A.T., Potts, P.J., Streli, C., Vanhoof, C., Wegrzynek, D., and
Wobrauschek, P. (2010). Atomic spectrometry update-X-ray fluorescence spec-
trometry.
J.Anal.At.Spectrom.
,
25
, 1503-1545.
18. West, M., Ellis, A.T., Potts, P.J., Streli, C., Vanhoof, C., Wegrzynek, D., and
Wobrauschek, P. (2012). Atomic spectrometry update-X-ray fluorescence spec-
trometry.
J.Anal.At.Spectrom.
,
27
, 1603-1644.
19. Karydas, A.G., Beckhoff, B., Bogovac, M., Darby, I., Eichert, D., Fliegauf, R.,
Gambitta, A., Grötzsch, D., Herzog, C., Jark, W., Kaiser, R.B., Kanngießer, B.,
Kiskinova, M., Lubeck, J., Malzer, W., Markowicz, A., Migliori, A., Sghaier, H.,
and Weser, J. (2013). Activities in the IAEA XRF laboratory.
XRFNewsletterof
IAEA
, editor A.G. Karydas, No.
24
,1-3.
20. Wobrauschek, P., Kregsamer, P., Ladisich, W., Rieder, R., and Streli. C. (1993).
Total-reflection X-ray fluorescence analysis using special X-ray sources.
Spectro-
chim.Acta
,
48B
, 143-151.
21. Takaura, N., Brennan, S., Pianetta, P., Laderman, S.S., Fischer-Colbrie, A.,
Kortright, J.B., Wherry, D.C., Miyazaki, K., and Shimazaki, A. (1995). Quanti-
tative consideration of background contributions to TXRF spectra for the case of
a Synchrotron radiation X-ray source.
Adv.X-rayChem.Anal.Jpn.
,
26s
,
113-118.
22. Klockenkämper, R. (1997).
Total-ReflectionX-RayFluorescenceAnalysis
, 1st ed.,
John Wiley & Sons, Inc., New York.
23. Rieder, R., Wobrauschek, P., Ladisich, W., Streli, C., Aiginger, H., Garbe, S., Gaul,
G., Knöchel, A., and Lechtenberg, F. (1995). Total reflection X-ray fluorescence
analysis with synchrotron radiation monochromatized by multilayer structures.
Nucl.Instr.Meth.
,
A355
, 648-653.
24. Streli, C., Wobrauschek, P., Ladisich, W., Rieder, R., Aiginger, H., Ryon, R.W.,
and Pianetta, P. (1994). Total reflection X-ray fluorescence analysis of light
elements using synchrotron radiation.
Nucl.Instr.Meth.
,
A345
, 399-403.
25. Laderman, S.S., Fischer-Colbrie, A., Shimazaki, A., Miyazaki, K., Brennan, S.,
Takaura, N., Pianetta, P., and Kortright, J.B. (1995). High sensitivity total reflec-
tion X-ray fluorescence spectroscopy of silicon wafers using synchrotron radiation.
Adv.X-rayChem.Anal.Jpn.
,
26s
,91-96.
26. Liu, K.Y., Kojima, S., Kawado, S., and Iida, A. (1995). SR-TXRF analysis of
metallic impurities on silicon surface.
Adv.X-rayChem.Anal.Jpn.
,
26s
, 107-112.
27. Iida, A., Yoshinaga, A., Sakurai, K., and Gohshi, Y. (1986). Synchrotron radiation
excited X-ray fluorescence analysis using total reflection of X-rays.
Anal.Chem.
,
58
, 394-397.
28. Matsushita, T., Iida, A., Ishikawa, T., Nakagiri, T., and Sakai, K. (1986). X-ray
standing waves excited in multilayered structures.
Nucl.Instr.Meth.
,
A246
,751-754.
29. Iida, A. (1991).
Adv.X-RayAnal.
,
34
, 23.
30. Iida, A. (1992).
Adv.X-RayAnal.
,
35B
, 795.
31. Krämer, M. (2007). Potentials of synchrotron radiation induced X-ray standing
waves and X-ray reflectivity measurements in material analysis, PhD Thesis,
University of Dortmund, 128 pages.
Search WWH ::
Custom Search