DIFFERENT FIELDS OF APPLICATIONS - Total-Reflection X-Ray Fluorescence Analysis and Related Methods - page 380

GI-XRF, 15 th International Conference on TXRF and related methods, Book of
Abstracts, O09, p. 91.
189. Di Fonzo, S., Jark, W., Lagomarsino, S., Cedola, A., Müller, B.R., and Pelka, J.B.
(1996). Electromagnetic field resonance in thin amorphous films: a root for non-
destructive localization of thin marker layers by use of a standard X-ray tube. Thin
SolidFilms , 287 , 288-292.
190. Brücher, M., von Bohlen, A., and Hergenröder, R. (2012). The distribution of the
contrast of X-ray standing waves fields in different media. Spectrochim.ActaPart ,
B71-72 ,62-69.
191. Köhnen, A., Brücher, M., Reckmann, A., Klesper, H., von Bohlen, A., Wagner, R.,
Herdt, A., Lützenkirchen-Hecht, D., Hergenröder, R., and Meerholz, K. (2012).
Tracing a moving thin-film reaction front with nanometer resolution. Macro-
molecules , 45 , 3487-3495.
192. Unterumsberger, R., Pollakowski, B., Müller, M., and Beckhoff, B. (2011). Com-
plementary characterization of buried layers by quantitative X-ray fluorescence
spectrometry under conventional and grazing incidence conditions. Anal.Chem. ,
83 , 8623-8628.
193. Brücher, M., Jacob, P., von Bohlen, A., Franzke, J., Sternemann, C., Paulus, M.,
and Hergenröder, R. (2009). Analysis of the ion distribution at a charged solid-
liquid interface using X-ray standing waves. Langmuir , 26 , 959-966.
194. Menzel, M. and Fittschen, U.E.A. (2013). TXRF analysis of sliver nanoparticles in
fabrics, 15 th International Conference on TXRF and related methods, Book of
Abstracts, P49, p. 123.
195. von Bohlen, A. (2010). Totalreflexions-Röntgenfluoreszenz an partikelförmigen
Feststoffen, Dissertation, Fachbereich Physik, Universität Dortmund.
196. Krämer, M., von Bohlen, A., Sternemann, C., Paulus, M., and Hergenröder, R.
(2006). X-ray standing waves: a method for thin-layered systems. J.Anal.At.
Spectrom. , 21 , 1136-1142.
197. Klockenkämper, R., von Bohlen, A., Moens, L., and Devos, W. (1993). Analytical
characterization of artists' pigments used in old and modern paintings by total-
reflection X-ray fluorescence. Spectrochim.Acta , 48B , 239-246.
198. Prange, A. (1989). Total reflection X-ray spectrometry: method and applications.
Spectrochim.Acta , 44B , 437-452.
199. Nishiwaki, Y., Shimoyama, M., Nakanishi, T., Ninomiya, T., and Nakai, I. (2006).
Application of total-reflection X-ray fluorescence spectrometry to small glass
fragments. Anal.Sci. , 22 , 1297-1300.
200. Nomura, S., Ninomiya, T., and Taniguchi, K. (1988). Trace elemental analysis of
titanium oxide pigments using total reflection X-ray fluorescence analysis. Adv.X-
RayAnal.Jpn. , 19 , 217-226.
201. Ninomiya, T., Nomura, S., Taniguchi, K., and Ikeda, S. (1995). Application of
GIXF to forensic samples. Adv.X-RayChem.Anal.Jpn. , 26s ,9-18.
202. Muratsu, S., Ninomiya, T., Kagoshima, Y., and Matsui, J. (2002). Trace elements of
drugs of abuse using synchrotron radiation total reflection X-ray fluorescence
analysis (SR-TXRF). J.ForensicSci. , 47 , 944-949.