INSTRUMENTATION FOR TXRF AND GI-XRF - Total-Reflection X-Ray Fluorescence Analysis and Related Methods - page 196

Figure3.30. Indicated output rate dependent on the true input rate of an EDS system with a Si(Li)
detector of 50 mm 2 front area. Due to the dead time losses, the curves deviate from the ideal straight
line and finally show a choking of the detector. Each curve corresponds to a certain spectral energy
resolution Δ E (in eV) and a dead time τ dead (in μ s), respectively. Constant dead time losses are
indicated by dashed straight lines with D values in percent. Figure from Ref. [2], reproduced with
permission. Copyright1996, John Wiley and Sons.
Figure3.31. Indicated output rate dependent on the true input rate of an EDS system with a recent
SDD of 25 mm 2 front area. These curves are similar to those of a Si(Li) detector (see Figure 3.30)
but with a choking at higher input rates. They follow the set of functions given by Equation 3.28.
The maxima are reached for a dead time loss of 63.2%. The input count rate for a Si(Li) can be up to
40 kcps; for an SDD it can reach about 1 Mcps.