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10. Krämer, M. (2007). Potentials of synchrotron radiation induced X-ray standing
waves and X-ray reflectivity measurements in material analysis. PhD thesis, Uni-
versity of Dortmund, 128 pages.
11. Krämer, M., von Bohlen, A., Sternemann, C., Paulus, M., and Hergenröder, R.
(2006). X-ray standing waves: a method for thin-layered systems.
J.Anal.At.
Spectrom.
,
21
, 1136-1142.
12. Krämer, M., von Bohlen, A., Sternemann, C., Paulus, M., and Hergenröder, R.
(2007). Synchrotron radiation induced X-ray standing waves analysis of layered
structures.
Appl.Surf.Sci.
,
253
, 3533-3542.
13. Zheludeva, S.I., Kovalchuk, M.V., Novikova, N.N., and Sosphenov, A.N. (1995).
The role of film thickness in the realization of X-ray waveguide effects at total
reflection.
Adv.X-RayChem.Anal.Jpn.
,
26s
, 181-186.
14. Barbee Jr., T.W. and Warburton, W.K. (1984). X-ray evanescent- and standing-
wave fluorescence studies using a layered synthetic microstructure.
Mater.Lett.
,
3
,
17-23.
15. Batterman, B.W. (1963).
Phys.Rev.
,
133
, A759.
16. Batterman, B.W. and Cole, H. (1964). Dynamical diffraction of X-rays by perfect
crystals.
Rev.Mod.Phys.
,
36
, 681-717.
17. Schwenke, H., Berneike, W., Knoth, J., and Weisbrod, U. (1989). How to use the
features of total reflection of X-rays for energy dispersive XRF.
Adv.X-RayAnal.
,
32
, 105-114.
18. Schwenke, H. and Knoth, J. (1993). Total reflection XRF, In: van Grieken, R. and
Markowicz, A. (editors)
HandbookonX-RaySpectrometry
, Vol.
14
, Practical
Spectroscopy Series, Dekker: New York, 453 pp.
19. Klockenkämper, R. and von Bohlen, A. (1989). Determination of the critical
thickness and the sensitivity of thin-film analysis by total reflection X-ray fluores-
cence spectrometry.
Spectrochim.Acta
,
44B
, 461-470.
20. Schwenke, H., Knoth, J., and Weisbrod, U. (1991). Current work on total reflection
X-ray fluorescence spectrometry at the GKSS Research Centre.
X-RaySpectrom.
,
20
, 277-281.
21. de Boer, D.K.G. (1991). X-ray standing waves and the critical sample thickness for
total-reflection X-ray fluorescence analysis.
Spectrochim.Acta
,
46B
, 1433-1436.
22. de Boer, D.K.G. and van den Hoogenhof, W.W. (1991). Total reflection X-ray
fluorescence of single and multiple thin-layer samples.
Spectrochim.Acta
,
46B
,
1323-1331.
23. Parratt, L.G. (1954). Surface studies of solids by total reflection of X-rays.
Phys.
Rev.
,
95
, 359-369.
24. Abelès, F. (1950). Recherches sur la propagation des ondes electromagnetiques
sinusoidales dans les milieux stratifies. Application aux couches minces.
Ann.Phys.
,
5
596-640 (part I) and 706-784 (part II).
25. Król, A., Sher, C.J., and Kao, Y.H. (1988). X-ray fluorescence of layered synthetic
materials with interfacial roughness.
Phys.Rev.
,
B38
, 8579-8592.
26. Gutschke, R. (1991). Diploma thesis, University of Hamburg.
27. Iida, A. (1992).
Adv.X-RayAnal.
,
35
, 795.
28. Sakurai, K. and Iida, A. (1992).
Adv.X-RayAnal.
,
35
, 813.
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