Hardware Reference
In-Depth Information
The application of the OOmCFP measurement procedure to shows how the COS-
MIC specification can be applied in the defects detection is precisely the main contri-
bution of this paper, since this approach can be used for other MDD proposals as
reference to improve the quality of their generated applications.
As future work, we plan to complete the definition of a list of defect types that may
be introduced in object-oriented conceptual models, and the evaluation in use (by
means of empirical studies) of the application of the OOmCFP measurement proce-
dure for the detection of these defects. This also implies the reengineering of the tool
that automates the OOmCFP procedure in order to automate the detection of defects.
Acknowledgments. This work has been developed with the support of MEC under
the project SESAMO TIN2007-62894.
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