Cryptography Reference
In-Depth Information
18.6 Conclusion
In this chapter, we describe an experimental environment for injecting faults into an
LSI mounted on a SASEBO board that uses a clock glitch to allow us to study how a
fault is injected and propagated in an LSI. We describe an experimental methodology
for fault injection using two clocks and show how the clock glitch affects the error
occurrence in the cryptographic modules. In order to verify the theoretical attack
methods, we perform the key retrieval of AES and RSA as examples, using the
faulty ciphertexts obtained from the experiments. The results in this work contribute
to the future study of fault analyses using actual devices.
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