Optical Diagnostics and Imaging - Applied Optics Fundamentals and Device Applications - page 318

imaging system selected for such a test configuration will require careful
consideration of scintillating screen fluorescence, decay characteristics, and
resolution limits. Similarly, the image intensifier resolution characteristics
should be well matched to the system application. The camera utilized for
image capture of the test sequence may be subject to upgrades as technical
advances permit higher sensitivity and reduced exposure time.
Further development of flash x-ray cinematography includes the possi-
bility of using directly illuminated CCD based detectors, UV scintillating
screens, and x-ray diffraction apertures to control and/or reduce x-ray expo-
sure regions [19,20]. Further advances in spatial metrology methods (such as
point cloud algorithms) will further enhance the analytical capabilities for
flash x-ray cinematography.
References
1. Developed by Boyd, J. University of Cincinnati. Private conversation with
author.
2. Okamura, Y., S. Yoshinaka, and S. Yamamoto. 1983. Measuring mode propa-
gation losses of integrated optical waveguides: A simple method. Appl. Opt .
22:3892.
3. Walker, R. G. 1985. Simple and accurate loss measurement techniques of semi-
conductor optical waveguides. Electron. Lett . 21:57.
4. See for example, Pankove, J. I. 1971. Optical Properties of Semiconductors .
Englewood Cliffs, NJ: Prentice Hall, pp. 89-90.
5. Moss, T. S. 1959. Optical Properties of Semiconductors . New York: Butterworth,
pp. 59-88.
6. Gooch, C. H. 1959. Gallium Arsenide Lasers . New York: Wiley-Interscience, p. 48.
7. Webster, G. 1983. Polaron Corporation. Private communication with author.
8. Blakemore, J. S. 1982. Semiconductor and other major properties of galluim
arsenide. J. Appl. Phys . 53 (10):123.
9. Conwell, E. and V. F. Weisskopf. 1950. Theory of impurity scattering in semicon-
ductors. Phys. Rev . 77:388.
10. Fagen, E. A. University of Delaware. 1984. Private conversation with author.
Haynes, J. R. and W. Schockley. March 1951. The mobility and life of injected
holes and electrons in germanium. Phys. Rev . 81:835-843.
11. Zavada, J. M., H. A. Jenkinson, T. J. Gavanis, R. G. Hunsperger, M. A. Mentzer,
D. C. Larson, and J. Comas. 1980. Temperature processing effects in proton-
implanted GaAs. Proceedings of SPIE 239. p. 157F.
12. Pollack, G. 2001. Cells, Gels and the Engines of Life . Seattle: Ebner and Sons
Publishers.
13. Prince, J. L. and M. L. Jonathan. 2006. Medical Imaging, Signals and Systems .
Upper Saddle River, NJ: Pearson Prentice Hall.
14. Mentzer, M. A., D. A. Herr, K. J. Brewer, N. Ojason, and H. A. Tarpine. January
2010. Detector development for x-ray imaging. Paper Presented at SPIE Photonics
West, Sanfrancisco, CA.