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Fig. 6. Main components of a digital STEM system. Bright-field detector (BF),
annular dark-field detector (ADF), analog-to-digital (A/D) and digital-to-analog
(D/A) convertors.
(ZP). ZP defines the residual signal from bright- and dark-field detectors in the
absence of an incident electron beam.
Note
the objective lens setting.
2.
Extract a rectangular region centered on a TMV particle (
Fig. 8
, panel B).
3.
Project (average) the extracted region along the long axis to form a 1D picture
(
Fig. 8
, panel C).
4.
Calculate the pixel intensity because of the filament (
pi
) (
Fig. 8
, panel C) from
the filament mass (
fm
), left background (
lbg
), and right background (
rbg
).
pi
=
fm
-
lbg
+ rbg / 2
(1)
5.
Correct the pixel intensity for fluctuations in probe intensity and detector effi-
ciency where
mlc
= 1, bf = bright-field panel and zp = zero probe level (
Fig. 8
,
panel A). Correct for the loss of electrons due to the carbon film, for a thin
(2-3 nm) film
cfi
= 1.015.
pi'
=
pi
×
mlc
/ (
bf
-
zp
)
×
cfi
(2)
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