Bibliography - Atomic Force Microscopy - page 230

[547] Braun, G.; Inagaki, K.; Estabrook, R. A.; Wood, D. K.; Levy, E.; Cleland, A. N.; Strouse, G.
F.; Reich, N. O., Gold nanoparticle decoration of DNA on silicon. Langmuir 2005, 21 (23),
10699-701.
[548] Zhao, W.; Brook, M. A.; Li, Y. F., Design of gold nanoparticle-based colorimetric biosensing
assays. ChemBioChem 2008, 9 (15), 2363-71.
[549] Braun, G.; Diechtierow, M.; Wilkinson, S.; Schmidt, F.; H¨ben, M.; Weinhold, E.; Reich, N.
O., Enzyme-directed positioning of nanoparticles on large DNA templates. Bioconjugate
Chemistry 2008, 19 (2), 476-79.
[550] Zdrojek, M.; Melin, T.; Diesinger, H.; Stievenard, D.; Gebicki, W.; Adamowicz, L., Charging
and discharging processes of carbon nanotubes probed by electrostatic force microscopy.
Journal of Applied Physics 2006, 100 (11), 114326.
[551] Yaish, Y.; Park, J. Y.; Rosenblatt, S.; Sazonova, V.; Brink, M.; McEuen, P. L., Electrical
nanoprobing of semiconducting carbon nanotubes using an atomic force microscope. Physical
Review Letters 2004, 92 (4), 046401.
[552] Bachtold, A.; Fuhrer, M. S.; Plyasunov, S.; Forero, M.; Anderson, E. H.; Zettl, A.; McEuen, P.
L., Scanned probe microscopy of electronic transport in carbon nanotubes. Physical Review
Letters 2000, 84 (26), 6082-85.
[553] Park, J. Y., Electrically tunable defects in metallic single-walled carbon nanotubes. Applied
Physics Letters 2007, 90 (2), 023112.
[554] Lu, W.; Wang, D.; Chen, L., Near-static dielectric polarization of individual carbon nano-
tubes. Nano Letters 2007, 7 (9), 2729-33.
[555] Park, J. Y.; Yaish, Y.; Brink, M.; Rosenblatt, S.; McEuen, P. L., Electrical cutting and nicking
of carbon nanotubes using an atomic force microscope. Applied Physics Letters 2002, 80 (23),
4446-48.
[556] Bozovic, D.; Bockrath, M.; Hafner, J. H.; Lieber, C. M.; Park, H.; Tinkham, M., Electronic
properties of mechanically induced kinks in single-walled carbon nanotubes. Applied Physics
Letters 2001, 78 (23), 3693-95.
[557] Bozovic, D.; Bockrath, M.; Hafner, J. H.; Lieber, C. M.; Park, H.; Tinkham, M., Plastic
deformations in mechanically strained single-walled carbon nanotubes. Physical Review B
2003, 67 (3), 033407.
[558] Barboza, A. P. M.; Gomes, A. P.; Archanjo, B. S.; Araujo, P. T.; Jorio, A.; Ferlauto, A. S.;
Mazzoni, M. S. C.; Chacham, H.; Neves, B. R. A., Deformation induced semiconductor-metal
transition in single wall carbon nanotubes probed by electric force microscopy. Physical
Review Letters 2008, 100 (25), 256804.
[559] Woodside, M. T.; McEuen, P. L., Scanned probe imaging of single-electron charge states in
nanotube quantum dots. Science 2002, 296 (5570), 1098-1101.
[560] Tanaka, I.; Kamiya, I.; Sakaki, H.; Qureshi, N.; Allen, J. S. J.; Petroff, P. M., Imaging and
probing electronic properties of self-assembled InAs quantum dots by atomic force micro-
scopy with conductive tip. Applied Physics Letters 1999, 74 (6), 844-46.
[561] Birjukovs, P.; Petkov, N.; Xu, J.; Svirksts, J.; Boland, J. J.; Holmes, J. D.; Erts, D., Electrical
characterization of bismuth sulfide nanowire arrays by conductive atomic force microscopy.
Journal of Physical Chemistry C 2008, 112 (49), 19680-85.
[562] Pan, N.; Wang, X. P.; Zhang, K.; Hu, H. L.; Xu, B.; Li, F. Q.; Hou, J. G., An approach to control
the tip shapes and properties of ZnO nanorods. Nanotechnology 2005, 16 (8), 1069-72.
[563] He, J. H.; Ho, S. T.; Wu, T. B.; Chen, L. J.; Wang, Z. L., Electrical and photoelectrical
performances of nano-photodiode based on ZnO nanowires. Chemical Physics Letters 2007,
435 (1-3), 119-22.
[564] Lucchesi, M.; Privitera, G.; Labardi, M.; Prevosto, D.; Capaccioli, S.; Pingue, P., Electrostatic
force microscopy and potentiometry of realistic nanostructured systems. Journal of Applied
Physics 2009, 105 (5), 54301.