Bibliography - Atomic Force Microscopy - page 218

[321] Bystrenova, E.; Radenovic, A.; Libioulle, L.; Dietler, G. Importance of substrate for bio-
logical imaging by AFM at low temperature. Scanning tunneling microscopy/spectroscopy
and related techniques: 12th International Conference . AIP: Eindhoven, Netherlands, 2003;
pp 461-66.
[322] Bhushan, B.; Tokachichu, D. R.; Keener, M. T.; Lee, S. C., Morphology and adhesion of
biomolecules on silicon based surfaces. Acta Biomaterialia 2005, 1 (3), 327-41.
[323] Olbrich, A.; Ebersberger, B.; Boit, C., Conducting atomic force microscopy for nanoscale
electrical characterization of thin SiO2. Applied Physics Letters 1998, 73 (21), 3114-16.
[324] Henke, L.; Nagy, N.; Krull, U. J., An AFM determination of the effects on surface roughness
caused by cleaning of fused silica and glass substrates in the process of optical biosensor
preparation. Biosensors & Bioelectronics 2002, 17 (6-7), 547-55.
[325] Banner, L. T.; Richter, A.; Pinkhassik, E., Pinhole-free large-grained atomically smooth Au
(111) substrates prepared by flame-annealed template stripping. Surface and Interface An-
alysis 2009, 41 (1), 49-55.
[326] Rundqvist, J.; Hoh, J. H.; Haviland, D. B., Substrate effects in poly(ethylene glycol) self-
assembled monolayers on granular and flame-annealed gold. Journal of Colloid and Interface
Science 2006, 301 (1), 337-41.
[327] Rundqvist, J.; Hoh, J. H.; Haviland, D. B., Poly(ethylene glycol) self-assembled monolayer
island growth. Langmuir 2005, 21 (7), 2981-87.
[328] Hegner, M.; Wagner, P.; Semenza, G., Ultralarge atomically flat template-stripped Au
surfaces for scanning probe microscopy. Surface Science 1993, 291 (1-2), 39-46.
[329] Wagner, P.; Hegner, M.; Guntherodt, H. J.; Semenza, G., Formation and in-situ modification
of monolayers chemisorbed on ultraflat template-stripped gold surfaces. Langmuir 1995, 11
(10), 3867-75.
[330] Mosley, D. W.; Chow, B. Y.; Jacobson, J. M., Solid-state bonding technique for template-
stripped ultraflat gold Substrates. Langmuir 2006, 22 (6), 2437-40.
[331] Cannara, R. J.; Eglin, M.; Carpick, R. W., Lateral force calibration in atomic force micro-
scopy: a new lateral force calibration method and general guidelines for optimization. Review
of Scientific Instruments 2006, 77 (5), 053701.
[332] Cain, R. G.; Reitsma, M. G.; Biggs, S.; Page, N. W., Quantitative comparison of three
calibration techniques for the lateral force microscope. Review of Scientific Instruments
2001, 72 (8), 3304-12.
[333] Prunici, P.; Hess, P., Quantitative characterization of crosstalk effects for friction force
microscopy with scan-by-probe SPMs. Ultramicroscopy 2008, 108 (7), 642-45.
[334] Leggett, G. J.; Brewer, N. J.; Chonga, K. S. L., Friction force microscopy: towards quantita-
tive analysis of molecular organisation with nanometre spatial resolution. Physical Chemistry
Chemical Physics 2005, 7 (6), 1107-20.
[335] Xie, H.; Vitard, J.; Haliyo, S.; Regnier, S.; Boukallel, M., Calibration of lateral force
measurements in atomic force microscopy with a piezoresistive force sensor. Review of
Scientific Instruments 2008, 79 (3), 033708.
[336] Cain, R. G.; Biggs, S.; Page, N. W., Force calibration in lateral force microscopy. Journal of
Colloid and Interface Science 2000, 227 (1), 55-65.
[337] Varenberg, M.; Etsion, I.; Halperin, G., An improved wedge calibration method for
lateral force in atomic force microscopy. Review of Scientific Instruments 2003, 74 (7),
3362-67.
[338] Ecke, S.; Raiteri, R.; Bonaccurso, E.; Reiner, C.; Deiseroth, H.-J.; Butt, H. J., Measuring
normal and friction forces acting on individual fine particles. Review of Scientific Instruments
2001, 72 (11), 4164-70.
[339] Asay, D. B.; Kim, S. H., Direct force balance method for atomic force microscopy lateral
force calibration. Review of Scientific Instruments 2006, 77 (4), 043903.