Bibliography - Atomic Force Microscopy - page 204

[56] Todd, B. A.; Eppell, S. J., A method to improve the quantitative analysis of SFM images at the
nanoscale. Surface Science 2001, 491 (3), 473-83.
[57] Tranchida, D.; Piccarolo, S.; Deblieck, R. A. C., Some experimental issues of AFM tip blind
estimation: the effect of noise and resolution. Measurement Science and Technology 2006, 10,
2630-36.
[58] Kitching, S.; Williams, P. M.; Roberts, C. J.; Davies, M. C.; Tendler, S. J. B., Quantifying
surface topography and scanning probe image reconstruction. Journal of Vacuum Science &
Technology B 1999, 17 (2), 273-79.
[59] Emerson, R. J.; Camesano, T. A., On the importance of precise calibration techniques for an
atomic force microscope. Ultramicroscopy 2006, 106 (4-5), 413-22.
[60] Higgins, M. J.; Proksch, R.; Sader, J. E.; Polcik, M.; Mc Endoo, S.; Cleveland, J. P.; Jarvis,
S. P., Noninvasive determination of optical lever sensitivity in atomic force microscopy.
Review of Scientific Instruments 2006, 77 (1), 013701.
[61] Green, C. P.; Lioe, H.; Cleveland, J. P.; Proksch, R.; Mulvaney, P.; Sader, J. E., Normal and
torsional spring constants of atomic force microscope cantilevers. Review of Scientific Instru-
ments 2004, 75 (6), 1988-96.
[62] Matei, G. A.; Thoreson, E. J.; Pratt, J. R.; Newell, D. B.; Burnham, N. A., Precision and
accuracy of thermal calibration of atomic force microscopy cantilevers. Review of Scientific
Instruments 2006, 77 (8), 083703.
[63] Burnham, N. A.; Chen, X.; Hodges, C. S.; Matei, G. A.; Thoreson, E. J.; Roberts, C. J.; Davies,
M. C.; Tendler, S. J. B., Comparison of calibration methods for atomic-force microscopy
cantilevers. Nanotechnology 2003, 14 (1), 1-6.
[64] Gibson, C. T.; Smith, D. A.; Roberts, C. J., Calibration of silicon atomic force microscope
cantilevers. Nanotechnology 2005, 16 (2), 234-38.
[65] Gibson, C. T.; Watson, G. S.; Myhra, S., Scanning force microscopy -Calibrative procedures
for 'best practice'. Scanning 1997, 19 (8), 564-81.
[66] Sader, J. E.; Chon, J. W. M.; Mulvaney, P., Calibration of rectangular atomic force microscope
cantilevers. Review of Scientific Instruments 1999, 70 (10), 3967-69.
[67] Sader, J. E.; Larson, I.; Mulvaney, P.; White, L. R., Method for the calibration of atomic force
microscope cantilevers. Review of Scientific Instruments 1995, 66 (7), 3789-98.
[68] Sader, J. E., Frequency response of cantilever beams immersed in viscous fluids with applica-
tions to the atomic force microscope. Journal of Applied Physics 1998, 84 (1), 64-76.
[69] Sader, J. E.; Pacifico, J.; Green, C. P.; Mulvaney, P., General scaling law for stiffness
measurement of small bodies with applications to the atomic force microscope. Journal of
Applied Physics 2005, 97 (12), 124903-7.
[70] Cleveland, J. P.; Manne, S.; Bocek, D.; Hansma, P. K., A nondestructive method for deter-
mining the spring constant of cantilevers for scanning force microscopy. Review of Scientific
Instruments 1993, 64 (2), 403-5.
[71] Jing, G. Y.; Ma, J.; Yu, D. P., Calibration of the spring constant of AFM cantilever. Journal of
Electron Microscopy 2007, 56 (1), 21-25.
[72] Hutter, J. L.; Bechhoefer, J., Calibration of atomic-force microscope tips. Review of Scientific
Instruments 1993, 64 (7), 1868-73.
[73] Hutter, J. L., Comment on tilt of atomic force microscope cantilevers: effect on spring constant
and adhesion measurements. Langmuir 2005, 21 (6), 2630-32.
[74] Gates, R. S.; Reitsma, M. G., Precise atomic force microscope cantilever spring constant
calibration using a reference cantilever array. Review of Scientific Instruments 2007, 78 (8),
086101-3.
[75] Tortonese, M.; Kirk, M., Characterization of application specific probes for SPMs. In Micro-
machining and Imaging , Michalske, T. A.; Wendman, M. A., Eds. SPIE - Int. Soc. Optical
Engineering: Bellingham, 1997; Vol. 3009, pp 53-60.