Biomolecular Recognition: Analysis of DFS Data - Dynamic Force Spectroscopy and Biomolecular Recognition - page 176

(a)

Sample retract force-displacement curves

-100 0 100 200 300 400

Piezo Z displacement (nm)

(b)

beg end F_rupt D_Frupt I.S Noise hresh ksamp I.R samp

020.8
043.5

0.24.4
044.2

-045
-043

-035
-052

01.57
00.86

17.80
22.60

27.00
27.00

001.84
000.93

1366
0747

beg
031.4
079.6

end F_rupt D_Frupt I.S Noise hresh ksamp I.R samp

033.6
082.3

-226
-108

-178
-098

08.13
00.74

41.73
24.97

36.00
36.00

037.17
000.80

7086
0644

beg
039.7

end F_rupt D_Frupt I.S Noise hresh ksamp I.R samp

043.3 -285 -282 07.46 26.56 22.00 026.40 6506

beg
026.7

end F_rupt D_Frupt I.S Noise hresh ksamp I.R samp

028.0 -195 -177 07.24 13.92 32.00 023.78 6309

beg
037.2
043.0

end F_rupt D_Frupt I.S Noise hresh ksamp I.R samp

040.3
046.0

-257
-112

-164
-101

07.18
04.00

23.14
30.75

17.00
17.00

023.19
006.50

6261
3489

FIGURE 5.6 Identification of unbinding events. (a) Five experimental force-displacement
(FD) curves showing only the retract section. Each of these retract curves has been automat-
ically analyzed by YieldFinder to identify rupture events. (b) Modeling the five FD curves
shown in (a) using YieldFinder. Raw data is shown in black, and fitted model is drawn in
gray segments. An insert is shown on each curve and provides detected values by YieldFinder
(variable names will be shown in italic). Beg and end values identify the beginning and the end
of rupture events in nanometer. F rupt and D Frupt are the maximum and the event rupture
forces, respectively. LS is the loading slope before the rupture (known as k eq in Section 5.5).
Noise is the observed noise on the approach curve. Thresh is the force threshold used to auto-
matically select rupture events. k samp and LR samp are the k samp value (see Section 5.5) and the
effective loading rate value ( r e ), respectively. In YieldFinder, the threshold value is controlled
by the user, but it applied on every FD curves loaded.