Environmental Engineering Reference
In-Depth Information
49. Kubo, R., Jr. (1966) The fluctuation-dissipation theorem,
Rep. Prog.
Phys.
,
29
,255-284.
50. Yu, D. K., Zhang, R. Q., and Lee, S. T., Jr. (2002) Structural transition in
nanosized silicon clusters,
Phys. Rev. B
,
65
(24),245417.
51. Hofmeister, H., Huisken, F., and Kohn, B., Jr. (1999) Lattice contraction
in nanosized silicon particles produced by laser pyrolysis of silane,
Eur.
Phys.J.D
,
9
(1),137-140.
52. Yu, D. K., Zhang, R. Q., and Lee, S. T., Jr. (2002) Structural properties
of hydrogenated silicon nanocrystals and nanoclusters,
J. Appl. Phys.
,
92
(12),7453.
53. Dickey,J.M.,andPaskin,A.,Jr.(1969)Computersimulationofthelattice
dynamics of solids,
Phys. Rev.
,
188
(3),1407-1418.
54. Shamsa, M., Ghosh, S., Calizo, I., Ralchenko, V., Popovich, A., and
Balandin, A. A., Jr. (2008) Thermal conductivity of nitrogenated
ultrananocrystalline diamond films on silicon,
J. Appl. Phys.
,
103
(8),
083538.
55. Yang, H. N., and Lu, T. M., Jr. (1991) Enhancement of thermal diffuse
scattering by surface defects,
Phys. Rev. B
,
44
(20),11457-11464.
56. Tsu, D. V., Lucovsky, G., and Mantini, M. J., Jr. (1986) Local atomic
structure in thin films of silicon nitride and silicon dimide produced
by remote plasma-enhanced chemical-vapor deposition,
Phys. Rev. B
,
33
(10),7069-7076.
