Hardware Reference
In-Depth Information
ratio ::: In addition to the logic-based and current-based techniques, some works
have investigated the possibility of varying the test conditions such as temperature
or power supply voltage.
Fault models can be used for testing purposes but also for diagnosis purposes.
In this way, the wired and voting models have initially been used for diagnosis.
Some works take into consideration the resistance of the bridging defect and more
precisely the value of the critical resistance.
As it is well-known, the main objective of diagnosis is to increase accuracy by
reducing the list of initial candidates. Many logic-based techniques have been pro-
posed to reduce the set of candidates as much as possible. However, it is clear that
additional information is required to further decrease the list of candidates.
This chapter gives a broad view of the state-of-the-art of modeling bridging de-
fects. From the initial and simplistic models to the most recent ones which are
realistic, accurate and easy to handle, we observe a drastic improvement of the
knowledge of the bridging defect behaviour which translates to better quality test
sequences. The advances observed for the case of bridging defects have to be
considered as an exemplary guideline for defect-oriented test strategies. Similar
research and developments are today dedicated to other types of defect such as re-
sistive opens.
References
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