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Rodrıguez-Monta nes R, Arumı D, Figueras J, Eichenberger S, Hora C, Kruseman B, Lousberg M,
Majhi AK (2007a) Diagnosis of full open defects in interconnecting lines. VLSI test sympo-
sium, pp 158-166
Rodrıguez-Monta nes R, Arumı D, Figueras J, Eichenberger S, Hora C, Kruseman B (Oct 2007b)
Impact of gate tunneling leakage on CMOS circuits with full open defects. Electron Lett
43(21):1440-1441
Rodrıguez-Monta nes R, Arumı D, Figueras J, Eichenberger S, Hora C, Kruseman B (2008) Time-
dependent behaviour of full open defects in interconnect lines. International test conference, pp
1-10
Sakurai T (Jan 1993) Closed-form expressions for interconnection delay, coupling, and crosstalk
in VLSIs. IEEE transaction on electron devices, pp 118-124
Sato Y, Yamazaki L, Yamanaka H, Ikeda T, Takakura M (2002) A persistent diagnostic technique
for unstable defects. International test conference, pp 242-249
Singh AD, Rasheed H, Weber WW (1995) I DDQ testing of CMOS opens: an experimental study.
International test conference, pp 479-489
Soden JM, Treece RK, Taylor MR, Hawkins CF (1989) CMOS IC stuck-open fault electrical ef-
fects and design considerations. International test conference, pp 423-430
Stamper A, McDevitt TL, Luce SL (1998) Sub-0.25-micron interconnect scaling: damascene cop-
per versus subtractive aluminum. IEEE advanced semiconductor manufacturing conference, pp
337-346
Thompson KM (1996) Intel and the myths of test. IEEE Des Test Comput 13(1):79-81
Venkataraman S, Drummonds SB (2000) A technique for logic fault diagnosis of interconnect open
defects. VLSI test symposium, pp 313-318
Wadsack RL (1978) Fault modelling and logic simulation of CMOS and MOS integrated circuits.
Bell SysTech J 811(57):1449-1474
Xue H, Di C, Jess JAG (1994) Probability analysis for CMOS floating gate faults European design
and test conference pp 443-448
Yan H, Singh AD (2005) A delay test to differentiate resistive interconnect faults from weak tran-
sistor defects. International conference on VLSI design, pp 47-52
Zou W, Cheng W-T, Reddy SM (2006) Interconnect open defect diagnosis with physical informa-
tion. Asian test symposium, pp 203-209
 
 
 
 
 
 
 
 
 
 
 
 
 
 
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