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23. D. Bhaduri, S. K. Shukla, P. Graham, and H. Quinn. Transient error tolerant
configuration of nanofabrics using a reliability driven probabilistic approach. In:
International Conference on Bio-Nano- Informatics Fusion, July 2005.
24. D. Bhaduri, S. K. Shukla, P. Graham, and M. Gokhale. Reliability analysis of fault
tolerant reconfigurable architectures. In: IEEE International workshop on Design and
Test of Defect-Tolerant Nanoscale Architectures (NANOARCH), May 2005. http://
fermat.ece.vt.edu/Publications/pubs/techrep/techrep0415.pdf.
25. D. Bhaduri and S. Shukla. Probabilistic analysis of self-assembled molecular networks.
In: Proceedings of Foundations of NANOSCIENCE (FNANO), May 2005.
26. M. Jacome, C. He, G. Veciana, and S. Bijansky. Defect tolerant probabilistic design
paradigm for nanotechnologies. In DAC, June 2004: pp 596-601.
27. J. Koeter. What's an lfsr? (rev. a). Texas Instruments. Tech. Report, 1996. http://
www.ti.com/sc/docs/psheets/abstract/apps/scta036a.htm.
28. D. Bhaduri, S. Shukla, P. Graham, and M. Gokhale. Comparing reliability-redun-
dancy trade-offs for two von neumann multiplexing architectures. IEEE Transactions
on Nanotechnology, to appear 2007. http://fermat.ece.vt.edu/Publications/online-
papers/Nano/MUX_TNANO.pdf.
29. http://www.cs.wm.edu/
ciardo/SMART/.
30. K. Patel, I. L. Markov, and J. P. Hayes. Evaluating circuit reliability under
probabilistic gate- fault models. In: International Workshop on Logic Synthesis
(IWLS), 2003: pp 59-64.
31. S. Krishnaswamy, G. F. Viamontes, I. L. Markov, and J. P. Hayes. Accurate Reliability
Evaluation and Enhancement via Probabilistic Transfer Matrices. New York: ACM
Press, 2005, pp 282-287.
32. J. Han, E. Taylor, J. Gao, and J. Fortes. Faults, error bounds and reliability of
nanoelectronic circuits. In: ASAP, 2005: pp 247-253.
33. D. Parker. Implementation of symbolic model checking for probabilistic systems.
University of Birmingham. Ph.D. dissertation, 2002.
34. H. Hansson and B. Jonsson. A logic for reasoning about time and probability. Formal
Aspects of Computing, 6(5): pp 512-535, 1994.
35. A. Bianco and L. de Alfaro. Model checking of probabilistic and nondeterministic
systems. In: Foundations of Software Technology and Theoretical Computer Science
(FSTTCS'95), ser. LNCS, 1026,New York: Springer, 1995: pp 499-513.
36. A. Aziz, K. Sanwal, V. Singhal, and R. Brayton. Verifying continuous time
Markov chains. In: Conference on Computer-Aided Verification (CAV' 96), July
1996: pp 269-276.
37. C. Baier, J. P. Katoen, and H. Hermanns. Approximate symbolic model checking of
continuous time Markov chains. In: International Conference on Concurrency Theory
(CONCUR'99), Eindhoven, August 1999, pp 146-161.
38. www.cs.bham.ac.uk/ B dxp/prism/.
39. M. Kwiatkowska, G. Norman, and D. Parker. Prism: probabilistic symbolic model
checker. In: TOOLS 2002, ser. LNCS, 2324. New York: Springer April 2002:
pp 200-204.
40. D. Bhaduri and S. Shukla, Nanoprism: A tool for evaluating granularity vs. reliability
trade-offs in nano-architectures, In: GLSVLSI. Boston:, ACM, April 2004.
B
 
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