Hardware Reference
In-Depth Information
FIGURE 31.1: Estimates of the relative increase in error rates as a function of
process technology. [Image courtesy of Report from the Inter-Agency Work-
shop on HPC Resilience at Extreme Scale [5].]
FIGURE 31.2: Relationship between soft errors and voltage scaling through
several process technology generations. [Image courtesy of Kaul, Himanshu,
et al. [9].]
Normally, those specifications include average and transient voltages, as well
as temperature and other physical variables. With the inherent growth of
complexity in advanced dynamic power management, the number of special,
at-the-limit cases in environmental specifications grows very rapidly; therefore
