Biomedical Engineering Reference
In-Depth Information
Reservoirs
Reserved
cells
Figure 4.22
Fabricated biochip for DNA sequencing.
Source
Pseudo
Sink
Te st
droplets
Pseudo
Figure 4.23
Column-test step of a parallel scan-like test.
Defect sites
Figure 4.24
Parallel scan-like diagnosis of a single-cell defect.
shown in
Figure 4.23
)
. Since nine electrodes are not reachable, the testing of
even columns and rows are not needed. The test application procedure takes
46 s, again for a 1 Hz actuation frequency.
Next, we study the time needed for a fault diagnosis for the two methods.
We use a fabricated chip, which is known to contain one defect a priori (deter-
mined by inspection and electrical measurements). The chip with the defect
is shown in Figure 4.24. For the Euler-path-based method, we carried out a
binary search to locate the defect cell. A total of seven iterations are needed,
and the total diagnosis time is 173 s. This value is obtained by summing up
