Environmental Engineering Reference
In-Depth Information
0.30 nm
0.21 nm
(031)
(011)
(020)
100 nm
20 nm
4nm
[100]
(d)
(e)
(f)
50 nm
50 nm
figure 3.8
TeM
ic
images and SAed patterns (a), (b), HR-TeM
ic
image (c), and Fe-SeM
ic
images (d)-(f) of as-prepared products.
Reprinted with permission from Ref. [117]. © 2010, American Chemical Society.
(a)
(b)
(c)
(d)
500 nm
100 nm
500 nm
100 nm
(e)
(f)
(g)
(h)
500 nm
100 nm
500 nm
100 nm
(i)
(j)
(k)
(l)
500 nm
100 nm
500 nm
100 nm
figure 3.9
SeM
ic
and TeM
ic
images of the truncated rhombic dodecahedral Cu
2
O nanoparticles: (a)-(d) type-I nanoframes, (e)-(h)
nanocages, and (i)-(l) type-II nanoframes. The magnified images clearly show the hollow structures of the nanoparticles. Reprinted with
permission from Ref. [118]. © 2008, American Chemical Society.