Environmental Engineering Reference
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0.30 nm
0.21 nm
(031)
(011)
(020)
100 nm
20 nm
4nm
[100]
(d)
(e)
(f)
50 nm
50 nm
figure 3.8 TeM ic images and SAed patterns (a), (b), HR-TeM ic image (c), and Fe-SeM ic images (d)-(f) of as-prepared products.
Reprinted with permission from Ref. [117]. © 2010, American Chemical Society.
(a)
(b)
(c)
(d)
500 nm
100 nm
500 nm
100 nm
(e)
(f)
(g)
(h)
500 nm
100 nm
500 nm
100 nm
(i)
(j)
(k)
(l)
500 nm
100 nm
500 nm
100 nm
figure 3.9 SeM ic and TeM ic images of the truncated rhombic dodecahedral Cu 2 O nanoparticles: (a)-(d) type-I nanoframes, (e)-(h)
nanocages, and (i)-(l) type-II nanoframes. The magnified images clearly show the hollow structures of the nanoparticles. Reprinted with
permission from Ref. [118]. © 2008, American Chemical Society.
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