Image Processing Reference
In-Depth Information
thickness are considered. It is especially important while comparing the perform-
ances of various photoconductors to one another:
V V i
S ¼ S 0 1
exp
(
10
:
23
)
L
L
where S 0 ¼ S 00 (
, with S 00 and V k0 as two additional param-
eters obtained from the physical properties of the photoconductor. The
L 0 )
and V k ¼ V k0 (
L 0 )
final PIDC
model is presented in Tables 10.3 and 10.4 that captures the functional form of the
TABLE 10.3
Exposure Model
General Springett - Melnyk Exposure Model:
V ( X ) V r
V i V r
e h 0
C X ¼ 0,
V ( X ) V i þ V c ln
þ
if p ¼ 1
( 10 : 17 )
"
#
p 1
p 1
V c
1 p
V c
V ( X ) V r
V c
V i V r
e h 0
C X ¼
V ( X ) V i þ
þ
0,
if p
1
(
10
:
18
)
QM Model (p ¼ 2):
q
b
V 2
c
V i V r SX
1
2
2
V ( X ) ¼ V r þ b þ
þ V 2
c
where b ¼
V i V r
( 10 : 19 )
(approximately, L = L 0 ¼
L
L 0
V r ¼ V r0
1)
,
, V k ¼ V k0
V V i
L
L 0
L
L 0
S ¼ S 0 1 exp
S 0 ¼ S 00
Dark Decay Model: Figure 10.7
Measured quantities: {V(X)} at different exposure points
Actuators: {V g , X}
TABLE 10.4
List of Parameters for a Photoconductor
QM PIDC Model
Parameters
Photoconductor
9 ergs = cm 2
X
334 V = (ergs = cm 2 )
S 00
V k0
325 V
a
0.258
V r0
20 V
L ¼ L 0
24
m
m
V i
(400
-
800) V
p
2
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