Chemistry Reference
In-Depth Information
APPENDIX
A
VALUES OF COMMONLY
USED PARAMETERS
The following table lists the most commonly used values of various parameters for
X-ray diffraction. The values of the three emission lines are converted from the values
of photon energy in the table 1-2 of X-ray Data Booklet, 2nd edition (edited by A. C.
Thompson, et al., Center for X-Ray Optics and Advanced Light Source, LBNL,
Berkeley, CA, January 2001). The relation between wavelength l (in A
) and photon
energy E (in eV) is given by l¼12398.4/E. The rest of the values are taken from
Elements of X-Ray Diffraction, 2nd edition (edited by B. D. Cullity, Addison-Wesley,
Reading, MA, 1978). The author believes the accuracy of the values is sufficient for
most applications although the actual accuracy may be less than the number of
significant figures. More values and their original sources can be found in the
International Table for X-ray Crystallography, Vol. C. (edited by A. J. C. Wilson,
Kluwer Academic Publishers, 1992).
