Chemistry Reference
In-Depth Information
temperatures (triangles) is shown on the right vertical scale. In this particular setup,
the actual temperature is higher than the setting temperature since the embedded
thermocouple is farther away from the instrument center and heating source.
REFERENCES
1. W. Busing and H. A. Levy, Angle calculations for 3- and 4- circle X-ray and neutron
diffractometers, Acta Crystallogr. 1967, 22, 457-464.
2. W. R. Massey Jr. and Philip C. Manor, A four-circle single crystal diffractometer with a
rotating anode source, J. Appl. Crystallogr. 1976, 9, 119-125.
3. D. J. Thomas, Modern equations of diffractometry. Goniometry, Acta Crystallogr. 1990,
A46, 321-343.
4. M. Lohmeier and E. Vlieg, Angle calculations for a six-circle surface X-ray diffractometer,
J. A.ppl Crystallogr. 1993, 26, 706-716.
5. E. Vlieg, Integrated intensities using a six-circle surface X-ray diffractometer, J. Appl.
Crystallogr. 1997, 30, 532-543.
6. P. Dera and A. Katrusiak, Towards general diffractometry. I. Normal-beam equatorial
geometry, Acta Crystallogr. 1998, A54, 653-660.
7. G. Thorkildsen, H. B. Larsenb, and J. A. Beukes, Angle calculations for a three-circle
goniostat, J. Appl. Crystallogr. 2006, 39, 151-157.
8. N. S. P. Bhuvanesh and J. H. Reibenspies, Anovel approach tomicro-sample X-ray powder
diffraction using nylon loops, J. Appl. Crystallogr. 2003, 36, 1480-1481.
9. S. Guggenheim, Simulations of Debye-Scherrer and Gandolfi patterns using a Bruker
Smart Apex diffractometer system, Bruker AXS Application Note 373. 2005.
10. M. F. Davis, C. Groter, and H. F. Kay, On choosing off-line automatic X-ray
diffractometers, J. Appl. Crystallogr. 1968, 1, 209-217.
11. R. Sanishvili, A 7 mm mini-beam improves diffraction data from small or imperfect
crystals of macromolecules, Acta Crystallogr. 2008, D64, 425-435.
12. I. C. Noyan, et al., Acost-effectivemethod for minimizing the sphere-of-confusion error of
X-ray diffractometers, Rev. Sci. Instrum. 1999, 70, 1300-1304.
13. R. Moukhametzianov, et al., Protein crystallographywith amicrometre-sized synchrotron-
radiation beam, Acta Crystallogr. 2008, D64, 158-166.
14. J. P. Cline, NIST standard reference materials for characterization of instrument
performance, Industrial Applications of X-Ray Diffraction, edited by F. H. Chung and
D. K. Smith, Marcel Dekker, New York, 2000, 903-917.
15. B. B. He and R. C. Bollig, X-ray diffraction screening system convertible between
reflection and transmission modes, US Patent 7,242,745, July 10, 2007.
16. J. Fink, et al., X-ray micro diffractometer sample positioner, US Patent 5,359,640, October
25, 1994.
17. S. T. Misture, E. A. Payzant, and C. R. Hubbard, Handout of high temperature XRD
workshop, The 47th Annual Denver X-ray Conference, August 4, 1998.
18. M. Rodriguez, High-temperature and nonambient X-ray diffraction, Industrial
Applications of X-Ray Diffraction, edited by F. H. Chung and D. K. Smith, Marcel
Dekker, New York, 2000, 891-902.
Search WWH ::




Custom Search