Environmental Engineering Reference
In-Depth Information
of cells is determined by the formula [4.26].
Suppose the
i
i-th element of a structure is divided into
i
cells. Cells
are arranged in
jj
groups with
L
j
i
being the number of cells in each group.
The probability of nucleation of a defect in any cell
P
i
jj
(τ
l
) at time τ
l
is
determined for each group.
To determine the number of nucleated defects in the
jj
-th group of cells,
it is assumed that the nucleation of defects in the group is described by a
binomial distribution, i.e. the cells are independent and
P
i
jj
(τ
l
) is the same
for all cells of one group
i
k
i
k
i
n k
−
P kn C P
( / ) = [ ( )] [1- ( )] ,
t
P
t
[4.27]
jj
n
jj
1
jj
1
i
jj
Pkn
t
is the probability of nucleation of defects in the
jj
-th
group of the
i
i-th element at time τ
l
;
n
=
( / ) (
)
where
l
i
j
L
is the number of cells in the
jj-
th
k
C
is the binomial coefficient, defined as
group,
n
!
[4.28]
C
k
n
=
.
(
)
knk
!
−
!
Based on the properties of the binomial distribution [4.27], the
mathematical expectation of nucleated defects in the
jj
i-th group of the
i
-th
element at time τ is equal to
i
i
i
v LP
(
t ×t
)=
(
).
[4.29]
jj
1
jj
jj
1
where
v
i
jj
(τ
l
) is the mathematical expectation of the number of nucleated
defects in the
jj
i-th group of
i
i-th element at time τ
l
.
Then for the
i
i-th element the mathematical expectation of the number
of nucleated defects at time τ is defined as follows:
jj
∑
v
i
()=
t
v
i
( .
t
[4.30]
n
1
jj
1
ii
=
1
where
v
i
n
(τ
l
) is the expected number of nucleated defects in the
i
i-th element
at time τ
l
.
In this case, the mathematical expectation of the number of nucleated
defects at time interval Δτ
l
is
i
i
i
v
(
Dt
) =
v
(
t × t
)
v
(
).
[4.31]
n
1
n
1
ni
−
1
Given that the nucleated defects are equally likely to be found in any
cell of a group of cells, it may be assumed that defects nucleate both far
away from each other and also in the neighbouring cells. Also, if a defect
formed in a cell away from other cells, the size of the nucleated defect
corresponds to the sensitivity of inspection of metal, that is, for example,
in accordance with R
ef. 6
5
a
= 0.54
Fl
;
= 5 0.05.
a
[4.32]
0.05
sens
0.05
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