Materials Problems and Approaches for TEM and TEM/STEM Analyses - Sample Preparation Topic for Transmission Electron Microscopy - page 71

a b

c

d

e f

g h

Fig. 4.11 Different types of electron diffraction patterns, from single-crystal structure using
SAED (a), microdiffraction (f), CBED (e) and LACBED (g) to bicristal structure (b), polycrys-
tallized (c), microcrystallized (d) and to amorphous structures (h) using SAED mode in SAED
( J. Ayache, CSNSM-IN2P3-CNRS, Orsay )

taining light atoms, such as oxygen, will require the additional use of neutron
diffraction. The major drawback of this technique is the large quantity of material
needed (cubic millimeters instead of a few nanometers for the TEM).