Comparisons of Techniques - Sample Preparation Topic for Transmission Electron Microscopy - page 200

Fig. 8.1 The thin slice is
obtained using the crushing
technique and therefore, the
substrate is maintained. The
arrows indicate the platinum
particles superimposed on the
substrate, cerium oxide. The
platinum particles are
epitaxied with the substrate
(moiré fringes). ( M. Abid,
LMPC-ECPM-ULP
Strasbourg )

Fig. 8.2 Same as in Fig. 8.1,
showing the planes of the
cerium oxide, which have
interreticular distances of d =

3.125 Å and moirés of
platinum particles, which
indicate that they are
epitaxied on the cerium
oxide. ( M. Abid,
LMPC-ECPM-ULP
Strasbourg )

Fig. 8.3 The material is
prepared using the extractive
replica technique; the
substrate is removed by
means of chemical etching,
only the shadowing of the
cerium oxide is kept. The
platinum particles are
indicated by arrows .The
particle-substrate interaction
is lost and therefore,
observation is more difficult.
( M. Abid, LMPC-ECPM-ULP
Strasbourg )