Selection of Preparation Techniques Based on Material Problems and TEM Analyses - Sample Preparation Topic for Transmission Electron Microscopy - page 193

11.7 Final Cleaning of the Thin Slice

Samples that are stored for more than a few hours will be contaminated by the
atmosphere. Before observation, and especially before HRTEM observation or
microanalysis, it is essential to clean the sample surfaces in order to prevent any
additional contamination under the electron beam. This step can be carried out using
a plasma cleaner (argon, argon/oxygen, etc.). This step is necessary for observations
with a FEG microscope (TEM/STEM and STEM).

12 Conclusion

Depending on the type of analysis to be made, the material type, and the material
properties, we generally can choose from several techniques.

Table 7.7 Flowchart of the possible methods for preparing different types of thin slices based on
the sample types

Sample Preparation Flow Chart

Bulk

Surface Interfaces Fragments and Particles

Longitudinal Plane Cross Section

Cutout

Embedding or
Infiltration-Embedding

Dispersion on
Support Film

Pre-Thinning

Plane View Cross Section Cleaving

Staining if Contrast
is Weak

Final thinning:
Electrolytic
Chemical
Mechanical
Ionic/FIB

Ultramicrotomy

Replica

Sample + TEM Support

Self-Supported Sample

Embedded or Impregnated
Sample+ TEM Support