Biomedical Engineering Reference
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Fig. 6.58
Bright-field TEM
image of an interface of
Si-Fe/SiO
2
prepared using
ultramicrotomy, showing the
structure of the SiO
2
after a
short exposure to the electron
beam (
D. Laub, EPFL-CIME,
Lausanne
)
Fig. 6.59
Same region as
shown in Fig.
6.58.
This
image shows the structure of
SiO
2
after an approximately
1-min exposure under the
electron beam. A porous
structure has formed
(
D. Laub, EPFL-CIME,
Lausanne
)
Structure after milling
under the beam for ~ 1 minute,
porous structure formed
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