Biomedical Engineering Reference
In-Depth Information
Fig. 6.28
Bright-field TEM
image. This is the same
sample as shown in Fig.
6.27,
but instead focuses on another
area where all of the layers
were damaged and covered
with redeposited particles.
Dark particles on the layers
have been abraded and
redeposited on the material
during ion milling. They
make observation difficult
(
D. Laub, EPFL-CIME,
Lausanne
)
Fig. 6.29
Bright-field TEM
image of a YBa
2
Cu
3
O
7
ceramic, prepared using the
ion milling technique,
showing: (1) amorphization
of the material at the edges of
the twin walls in the very thin
zones, (2) precipitates
(
arrows
) due to the demixing
of YBa
2
Cu
3
O
7
, first under
the action of the ion beam and
then the electron beam
(
J. Ayache,
CNRS-UMR8126-IGR,
Vi l lejui f
)
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