Chemistry Reference
In-Depth Information
15. C. Hopf, T. Schwarz-Selinger, W. Jacob, and A. von Keudell.
J. Appl. Phys.
, 87:2719,
2000.
16. J. Perrin, Y. Takeda, N. Hirano, Y. Takeuchi, and A. Matsuda.
Surf.Sci.
, 210:114, 1989.
17. A. Matsuda, K. Nomoto, Y. Takeuchi, A. Suzuki, Y. Yuuki, and J. Perrin.
Surf. Sci.
,
227:50, 1990.
18. D.A. Doughty, J.R. Doyle, G.H. Lin, and A. Gallagher.
J. Appl. Phys.
, 67:6220,
1990.
19. A. Nuruddin, J.R. Doyle, and J.R. Abelson.
J. Appl. Phys.
, 76:3123, 1994.
20. M. Shiratani, J. Jolly, H. Videlot, and J. Perrin.
Jpn. J. Appl. Phys.
, 36:4752, 1997.
21. P. Pecher and W. Jacob.
Appl. Phys. Lett.
, 73:31, 1998.
22. P. Pecher. PhD thesis, Universität Bayreuth, Bayreuth, Germany, 1997.
23. R. Street.
Hydrogenated Amorphous Silicon
, 1st edn. Cambridge University Press,
Cambridge, U.K., 1992.
24. K. Tanaka and A. Matsuda.
Mater. Sci. Rep.
, 2:139, 1987.
25. J.R. Doyle, D.A. Doughty, and A. Gallagher.
J. Appl. Phys.
, 71:4771, 1992.
26. R. Robertson and A. Gallagher.
J. Appl. Phys.
, 59:3402, 1986.
27. J. Perrin.
J. Non-Cryst. Solids
, 137-138:639, 1991.
28. A. Gallagher.
Mat. Res. Soc. Proc.
, 70:3, 1986.
29. K. Maeda, A. Kuroe, and I. Umezu.
Phys. Rev. B
, 51:10635, 1995.
30. Y. Toyoshima, K. Arai, A. Matsuda, and K. Tanaka.
Appl. Phys. Lett.
, 57:1028, 1990.
31. Y. Toyoshima, K. Arai, A. Matsuda, and K. Tanaka.
Appl. Phys. Lett.
, 56:1540, 1990.
32. S. Yamasaki, T. Umeda, J. Isoya, and K. Tanaka.
Appl. Phys. Lett.
, 70:1137, 1997.
33. T. Ohira, T. Adachi, Y. Takeuchi, and M. Murata.
Phys. Rev. B
, 52:8283, 1995.
34. A. von Keudell and J.R. Abelson.
Phys. Rev. B
, 59:5791, 1999.
35. E. Aydil, S. Agarwal, M. Valipa, B. Hoex, M. van de Sanden, and D. Maroudas.
Surf.
Sci.
, 598:35, 2005.
36. W. Kessels, Private communication. 2006.
37. J. Abelson.
Appl. Phys. A
, 56:493, 1993.
38. J. Thornton.
J. Vac. Sci. Technol.
, 4:3059, 1986. References 127.
39. J. Thornton and A. Penfold. In J. Vossen and W. Kern, eds.,
Thin Film Processes
.
Academic Press, New York, 1978.
40. Y. Lifshitz, S.R. Kasi, J.W. Rabalais, and W. Eckstein.
Phys. Rev. B
, 41:10468, 1990.
41. J. Robertson.
Diam. Relat. Mater.
, 2:984, 1993.
42. A. von Keudell, W. Möller, and R. Hytry.
Appl. Phys. Lett.
, 62:937, 1993.
43. A. von Keudell and W. Möller.
J. Appl. Phys.
, 75:7718, 1994.
44. W. Möller, W. Fukarek, K. Lange, A. von Keudell, and W. Jacob.
Jpn. J. Appl. Phys.
,
34:2163, 1995.
45. W. Eckstein and J.P. Biersack.
Z. Phys.
, B63:471, 1986.
46. H. Deutsch, H. Kersten, and A. Rutscher.
Contrib. Plasma Phys.
, 29:263, 1989.
47. R.A. Haefer.
Oberflächen- und Dünnschichttechnologie
. Springer, Berlin, Germany,
1991.
48. M. Balooch, D.R. Olander, and W.J. Siekhaus.
J. Vac. Sci. Technol. B
, 4:794, 1986.
49. H. Kersten, H. Deutsch, H. Steffen, G.M.W. Kroesen, and R. Hippler.
Vacuum
,
63:385, 2001.
50. A. Durandet, O. Joubert, J. Pelletier, and M. Pichot.
J. Appl. Phys.
, 67:3862, 1990.
51. H. Kersten, H. Deutsch, and J.F. Behnke.
Vacuum
, 48:123, 1997.
52. H. Schmoranzer and R. Zietz. Observation of selectively excited continuous vacuum
ultraviolet emission in molecular hydrogen.
Phys. Rev. A
, 18:1472-1475, 1978.