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The phase structure of the obtained ¿ lms was estimated on wide-angle scattering
diffractogram only qualitatively. Complexity of diffraction pictures of scattering and
structure do not poses the quantitative phase analysis of polymeric ¿ lms [20]. At the
phase analysis of polymers often it is necessary to be content with the comparative
qualitative analysis which allows watching evolution of structure depending on certain
parameters of technology of production. Measured wide-angle X-rays scattering dif-
fractograms of investigated ¿ lms are shown on Figure 3. Diffractograms has a typical
form for polymers. As a rule, polymers are the two-phase systems consisting of an
amorphous phase and areas with distant order, conditionally named crystals. Their dif-
fractograms represent [20] superposition of intensity of scattering by the amorphous
phase which is looking like wide halo on the small-angle area (in this case in area 2
θ
between 10
°
and 30
°
), and intensity Bragg peaks scattering by a crystal phase.
100.0
80.0
60.0
40.0
PE + 0.5% nc Si-97
PE + 1% nc Si-36
PE
20.0
Si(220)
Si(311)
Si(111)
Si(400)
Si(331)
0.0
50.0
10.0
30.0
80.0
20.0
60.0
70.0
Scattering angel 2
θ
[degree]
FIGURE 3
Diffractograms of the investigated composite films in comparison with
diffractogram of pure polyethylene. Below vertical strokes specify reference positions of
diffraction lines of silicon with their interference indexes (hkl).
Data on Figure 3 is presented in a scale of relative intensities (intensity of the
highest peak is accepted equal 100%). For convenience of consideration curves are
represented with displacement on an axis of ordinates. The scattering plots without
displacement represented completely overlapping of diffractogram pro¿ les of com-
posite ¿ lms with diffractogram of a pure LDPE ¿ lm, except peaks of crystal silicon
which were not present on PE diffractogram. It testi¿ es that additives of powders nc-Si
practically have not changed crystal structure of polymer.
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