Field and Laboratory Measurements Related to Occupational and Consumer Exposures - Safety of Nanomaterials along Their Lifecycle - page 283

TABLE 13.1
Recent Publications on Point Source or Fugitive Emission (Source Domain 1)

Synthesis
Process

Reference Nanomaterial Characterization Metric Summary/Conclusions

Ogura et al.
(2011)

CVD CNT SEM PNC, PSD

(14-740;
500-20,000)

In on-site aerosol measurements at a research facility manufacturing
and handling CNTs, airborne CNTs were only found inside a fume
hood and glove box, except for a small amount of CNTs released
from the glove box when it was opened. The airborne CNTs released
during the synthesis of CNTs were considered by the authors to be
practically negligible

Lee et al. (2011) CVD

(various
workplaces)

CNT STEM PNC, PSD

(14-500 nm)
PMC (25-3,200
nm)

Nanoparticles and ine particles were most frequently released after
the CVD (chemical vapor deposition) cover was opened, followed
by catalyst preparation

Lee et al. (2012) Induced

coupled
plasma with
electric
atomizer

Ag SMPS,

SEM-EDX,
TEM

PNC, PSD
(14-750 nm)
PMC

Spatial and personal measurements were conducted at this pilot plant
producing nanoAg-particles. Signiicantly increased PNC and PMC
for Ag were observed during reactor operation but no clear
quantiication of nanoAg-particles was conducted. The number of
particles ranged from 224-2,300 × 10 5 #/cm³ with the main fraction
in the particle size range <100 nm (measured with SMPS)

Leppänen et al.
(2012)

(enclosed)
Flame
spray
process

CeO 2 SEM/TEM PNC, PSD

(4-120;
10-11,000
nm), PSD/
PMD
30-10,000),
PMC

The average particle number concentration varied from 4.7 × 10 3 to
2.1 × 10 5 #/cm 3 inside the enclosure, and from 4.6 × 10 3 to 1.4 10 4
#/cm 3 outside the enclosure. The average mass concentrations inside
and outside the enclosure were 320 and 66 mg/m 3 , respectively. A
batch-type process caused signiicant variation in the concentrations,
especially inside the enclosure. CeO 2 NOAAs were mainly
chain-like aggregates, consisting of spherical 20-40 nm primary
particles having crystalline structures

( Continued )